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Characterization of Phase Purity in Organic Semiconductors by Lattice‐Phonon Confocal Raman Mapping: Application to Pentacene
Author(s) -
Brillante A.,
Bilotti I.,
Della Valle R. G.,
Venuti E.,
Masino M.,
Girlando A.
Publication year - 2005
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200501350
Subject(s) - pentacene , materials science , raman spectroscopy , phonon , organic semiconductor , semiconductor , characterization (materials science) , crystal (programming language) , chemical physics , crystal structure , phase (matter) , optoelectronics , optics , nanotechnology , crystallography , condensed matter physics , chemistry , organic chemistry , physics , layer (electronics) , thin film transistor , computer science , programming language
Lattice‐phonon confocal Raman mapping is a powerful technique to probe the crystal structure of polymorphs of organic semiconductors. This technique is fast, reliable, and capable of monitoring physical modifications and phase inhomogeneities in crystal domains at the micrometer scale. Applying the technique to pentacene crystals (see Figure) shows that phase inhomogeneities are not confined to the crystal surface, but penetrate into the crystal.