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Buried Linear Extrinsic Defects in Colloidal Photonic Crystals
Author(s) -
Vekris E.,
Kitaev V.,
von Freymann G.,
Perovic D. D.,
Aitchison J. S.,
Ozin G. A.
Publication year - 2005
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200401764
Subject(s) - materials science , photolithography , colloidal crystal , photonic crystal , colloid , photonics , nanotechnology , self assembly , optoelectronics , optics , chemical engineering , engineering , physics
Linear extrinsic defects can be embedded inside the lattice of a silica colloidal photonic‐crystal film via a directed self‐assembly strategy involving a combination of top–down photolithography and bottom–up colloidal assembly. High‐spatial‐resolution scanning micro‐optical spectroscopy proves to be an effective means of characterizing the photonic crystal properties of the buried defects (see Figure) within the film.