Spectroscopic Ellipsometric Evaluation of Gold Nanoparticle Thin Films Fabricated Using Layer‐by‐Layer Self‐Assembly | Zendy

Zhang H.L. | Zendy; Evans S.D. | Zendy; Henderson J.R. | Zendy

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Spectroscopic Ellipsometric Evaluation of Gold Nanoparticle Thin Films Fabricated Using Layer‐by‐Layer Self‐Assembly

Author(s) -

Zhang H.L.,

Evans S.D.,

Henderson J.R.

Publication year - 2003

Publication title -

advanced materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 10.707

H-Index - 527

eISSN - 1521-4095

pISSN - 0935-9648

DOI - 10.1002/adma.200390124

Subject(s) - materials science , ellipsometry , nanoparticle , layer (electronics) , colloidal gold , layer by layer , thin film , refractive index , dispersion (optics) , wavelength , optics , optoelectronics , nanotechnology , physics

Uniform thin films of gold nanoparticles have been fabricated on gold substrates using a layer‐by‐layer self‐assembly approach (see Figure). The optical properties of these nanoparticle films were characterized using variable‐angle spectroscopic ellipsometry, and the data modeled using a Lorentz oscillator dispersion model. Both the thickness and refractive indices were evaluated simultaneously over a wide wavelength range.

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