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Spectroscopic Ellipsometric Evaluation of Gold Nanoparticle Thin Films Fabricated Using Layer‐by‐Layer Self‐Assembly
Author(s) -
Zhang H.L.,
Evans S.D.,
Henderson J.R.
Publication year - 2003
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200390124
Subject(s) - materials science , ellipsometry , nanoparticle , layer (electronics) , colloidal gold , layer by layer , thin film , refractive index , dispersion (optics) , wavelength , optics , optoelectronics , nanotechnology , physics
Uniform thin films of gold nanoparticles have been fabricated on gold substrates using a layer‐by‐layer self‐assembly approach (see Figure). The optical properties of these nanoparticle films were characterized using variable‐angle spectroscopic ellipsometry, and the data modeled using a Lorentz oscillator dispersion model. Both the thickness and refractive indices were evaluated simultaneously over a wide wavelength range.