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Characterizing Joule Heating in Polymer Light‐Emitting Diodes Using a Scanning Thermal Microscope
Author(s) -
Boroumand F. A.,
Hammiche A.,
Hill G.,
Lidzey D. G.
Publication year - 2004
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200306128
Subject(s) - joule heating , materials science , scanning thermal microscopy , light emitting diode , optoelectronics , thermal , diode , microscope , joule (programming language) , optical microscope , microscopy , polymer , scanning electron microscope , nanotechnology , optics , composite material , atomic force microscopy , electrical engineering , physics , engineering , efficient energy use , meteorology
Scanning thermal microscopy (SThM) has been used to study Joule heating in conjugated polymer light‐emitting diodes (LEDs; see Figure). The operational temperature of the LED is found to be a strong function of device area: smaller LEDs exchange heat more efficiently with their surrounding environment. The results suggest that at high current density, Joule heating may be linked to device failure.