Premium
Semiconductive Polymer Blends: Correlating Structure with Transport Properties at the Nanoscale
Author(s) -
IonescuZanetti C.,
Mechler A.,
Carter S. A.,
Lal R.
Publication year - 2004
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200305747
Subject(s) - lamellar structure , materials science , nanoscopic scale , superstructure , polymer , electrode , conductive atomic force microscopy , atomic force microscopy , conductive polymer , polymer blend , phase (matter) , nanotechnology , chemical engineering , chemical physics , composite material , copolymer , chemistry , organic chemistry , oceanography , engineering , geology
Multimodal atomic force microscopy (AFM) was used to map charge transfer properties in correlation to the molecular superstructure of poly(ethyldioxythiophene)–poly(styrenesulfonic acid) (see Figure). The lamellar domains of the polymer blend are indicated by phase shifts. Efficient charge injection occurs when lamellar edges of the superstructure are exposed to a conductive AFM probe. Efficiency of charge injection at polymer–electrode interfaces could be enhanced by controlling lamellar orientation.