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Absorption and Emission in Quaterthienyl Thin Films
Author(s) -
Sun H.,
Zhao Z.,
Spano F.C.,
Beljonne D.,
Cornil J.,
Shuai Z.,
Brédas J.L.
Publication year - 2003
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200304770
Subject(s) - materials science , absorption (acoustics) , exciton , phonon , emission intensity , intensity (physics) , coupling (piping) , emission spectrum , absorption spectroscopy , molecular physics , thin film , spectral line , optics , optoelectronics , condensed matter physics , nanotechnology , photoluminescence , physics , composite material , astronomy
The salient features in the absorption and emission spectra of αT4 aggregates (see Figure) and films are fully accounted for using a model based on linear exciton–phonon coupling and structural defects. In particular, the Davydov splitting is calculated to be of the order of 1 eV, and the unusually small 0–0 emission intensity is attributed to the high sensitivity of the 0–0 intensity to basal plane structural defects.