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Second‐harmonic microscopy — a quantitative probe for molecular surface order
Author(s) -
Flörsheimer Mathias,
Bösch Martin,
Brillert Christof,
Wierschem Maria,
Fuchs Harald
Publication year - 1997
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19970091315
Subject(s) - materials science , second harmonic generation , microscopy , surface second harmonic generation , second harmonic imaging microscopy , harmonic , interpretation (philosophy) , optics , surface (topology) , atomic force microscopy , order (exchange) , high harmonic generation , optical microscope , nanotechnology , physics , scanning electron microscope , computer science , geometry , acoustics , composite material , laser , mathematics , programming language , finance , economics
Second‐harmonic microscopy —an application of which is presented in the previous article—is a fast quantitative technique for the imaging of interfaces such as that in the Figure. The theory of the technique, which is based on the generation of second‐harmonic light specifically at surfaces or interfaces due to their lack of centrosymmetry, is outlined and the interpretation of the results discussed.