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Molecular surface orientation field of a langmuir monolayer determined by second‐harmonic microscopy
Author(s) -
Flörsheimer Mathias,
Salmen Heiner,
Bösch Martin,
Brillert Christof,
Wierschem Maria,
Fuchs Harald
Publication year - 1997
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19970091314
Subject(s) - monolayer , materials science , langmuir , microscopy , characterization (materials science) , polar , harmonic , second harmonic generation , nanotechnology , chemical physics , optics , chemistry , physics , acoustics , adsorption , astronomy , laser
The characterization of a Langmuir monolayer at a water surface by means of second‐harmonic microscopy (SHM) is reported. Details of the technique and the theory are presented in the following article. The application described here illustrates the main advantages of SHM: it provides quantitative information on the microscopic level and reveals additional information compared to linear microscopy techniques. It is demonstrated to open up new perspectives for the development and improvement of polar organic materials, starting from polar monolayers at an interface.