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Nanometer‐size Cu clusters formed by reversible deintercalation on layered chalcogenides with scanning probe techniques
Author(s) -
Jaegermann Wolfram,
Jiang Lei,
Iyoda Tomakazu,
Tomm Yvonnne,
Pettenkofer Christian,
Hashimoto Kazuhito,
Fujishima Akira
Publication year - 1997
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19970090714
Subject(s) - materials science , intercalation (chemistry) , nanometre , scanning probe microscopy , nanotechnology , scanning electron microscope , atomic force microscopy , chemical engineering , inorganic chemistry , composite material , chemistry , engineering
Modification of surfaces by scanning probe techniques is the key to future nanotechnologies. In the novel approach described here, the reversible deintercalation of Cu from (0001) surfaces of 1T TaSe 2 by means of the atomic force microscope can produce large Cu clusters, such as that in the Figure, that can be reintercalated. A mechanism is proposed for the intercalation and tip‐induced deintercalation.