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Rectifying properties and photoconductivity of tetraruthenated nickel porphyrin films
Author(s) -
Araki Koiti,
Angnes Lúcio,
Toma Henrique E.
Publication year - 1995
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19950070609
Subject(s) - porphyrin , materials science , nickel , thin film , electrochemistry , homogeneous , photoconductivity , electrode , coating , photochemistry , photocurrent , optoelectronics , chemical engineering , nanotechnology , metallurgy , chemistry , physics , engineering , thermodynamics
Oxidation‐state selective modified electrodes based on tetraruthenated nickel porphyrin (see Figure) thin films are reported. The films are prepared by dip coating and are highly homogeneous and adherent, exhibiting a well‐controlled electrochemical and photoelectrochemical response. The films simulate a rectifying junction.