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Chemical imaging by scanning force microscopy
Author(s) -
Akari Sabri,
Horn Dieter,
Keller Harald,
Schrepp Wolfgang
Publication year - 1995
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19950070607
Subject(s) - materials science , scanning force microscopy , chemical imaging , nanotechnology , resolution (logic) , microscopy , atomic force microscopy , solid surface , high resolution , scanning probe microscopy , scanning ion conductance microscopy , scanning electron microscope , scanning confocal electron microscopy , optics , chemical physics , computer science , artificial intelligence , chemistry , composite material , remote sensing , hyperspectral imaging , physics , geology
The chemical imaging of surfaces with high lateral resolution i.e. the chemical identification of the materials which make up the surface was recently reported by Lieber et al. in Science . Here, work carried out partially in parallel using chemically modified SFM tips (see Figure) confirms the power of the technique and emphasizes its use for technical surfaces which normally show little contrast in SFM.