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The tomographic atom probe: New dimensions in materials analysis
Author(s) -
Deconoihout Bernard,
Chambreland Sylvain,
Blavette Didier
Publication year - 1994
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19940060918
Subject(s) - atom probe , materials science , atom (system on chip) , superalloy , nickel , atomic physics , nanotechnology , metallurgy , microstructure , physics , computer science , embedded system
The tomographic atom prob (TAP) is the most advanced of the three‐dimemsional atom probes currently in use. Atom probes are unique in that both the lateral and the depth resolution are high. The genera; development of atom probes and the principle of operation ot the TAP, in which the sample is field evaporated atomic loayer by atomic layer, are outlined. The analysis of a nickel base superalloy is given as an example of an application in metallurgy.