Premium
Surface nano‐topography of drawn polyethylene and its modification using scanning force microscopy
Author(s) -
Wawkuschewski Alexander,
Cantow HansJoachim,
Magonov Sergei N.
Publication year - 1994
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19940060607
Subject(s) - scanning force microscopy , materials science , polyethylene , polymer , perpendicular , nano , microscopy , nanotechnology , surface modification , scanning probe microscopy , hierarchy , composite material , atomic force microscopy , optics , chemical engineering , geometry , mathematics , physics , market economy , engineering , economics
Scanning force microscopy (SFM) of oriented polyethylene reveals additional structural details that are not accessible by other techniques. For example, the Figure show that, in addition to the main fibrillar features, there exist nanofibrils oriented perpendicular to the stretching direction. The unique contribution of SFM result to studies of the structural hierarchy of oriented polymers is discussed.