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Atomic resolution chemical analysis
Author(s) -
Browning Nigel D.,
Chisholm Matthew F.,
Pennycook Stephen J.
Publication year - 1994
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19940060418
Subject(s) - materials science , microanalysis , resolution (logic) , electron probe microanalysis , atomic number , atomic force microscopy , analytical chemistry (journal) , nanotechnology , scanning electron microscope , atomic physics , chemistry , physics , composite material , organic chemistry , chromatography , artificial intelligence , computer science
Chemical analysis on an atomic scales is now possible using the scanning transmissionn electron microscope. The experimental setup (Fig.) allows electron transmitted through the speciment to be collected and analyzed in a variety of ways, permitting atomic resolution microanalysis of selected atomic columns. This will indicate how bulk materials properties are influenced by the atomic structure of interfaces and defects.