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Scanning force microscopy on silver island film: Correlation between particle geometry and optical properties
Author(s) -
Schimmel Thomas,
Bingler HansGeorg,
Franzke Dieter,
Wokaun Alexander
Publication year - 1994
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19940060411
Subject(s) - materials science , optical microscope , annealing (glass) , microscopy , atomic force microscopy , optics , absorption (acoustics) , irradiation , laser , nanotechnology , composite material , scanning electron microscope , physics , nuclear physics
The behavior of metal island films needs to be studied if such films are to be used, as envisaged, in optical data communication and sensor technologies. The changes in surface topography of Ag island films on glass substrates upon thermal annealing (see Figure) and laser irradiation, as revealed by atomic force microscopy, are reported and correlated with the results of optical absorption supectrometry.