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Surface investigations of silylated substrates by TOF‐SIMS
Author(s) -
Hagenhoff Birgit,
Benninghoven Alfred,
StoppekLangner Karl,
Grobe Joseph
Publication year - 1994
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19940060209
Subject(s) - organosilicon , materials science , surface (topology) , secondary ion mass spectrometry , nanotechnology , organic chemistry , polymer chemistry , chemistry , ion , geometry , mathematics
Organosilicon compounds have found widespread use as protective coatings, especially agaist corrosive surface phenomena. TOF‐SIMS data are presented here that help to elucidate the products formed when organosilicon agents are coupled to oxidic surfaces. Evidence is found for silsequioxanes and their homo‐derivatives (see Figure), whose shynthesis normally requires special preparative conditions.