Premium
Scanning probe surface modification
Author(s) -
Corbitt Thomas S.,
Crooks Richard M.,
Ross Claudia B.,
HampdenSmith Mark J.,
Schoer Jonathan K.
Publication year - 1993
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19930051213
Subject(s) - scanning electron microscope , materials science , scanning probe microscopy , nanometre , monolayer , micrograph , substrate (aquarium) , resist , nanotechnology , scanning tunneling microscope , scanning ion conductance microscopy , surface modification , optics , scanning confocal electron microscopy , layer (electronics) , chemical engineering , composite material , physics , oceanography , geology , engineering
Nanometer‐scale manipulation of surfaces by scanning probe devices has expanded amazingly since the first reports in the mid‐1980s. General approaches to scanning probe microscope induced surface patterning are discussed. The Figure shows a scanning electron micrograph of an STM‐defined pattern of a HS(CH 2 ) 17 CH 3 monolayer resist on a Au(111) substrate.