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Structural studies on Superconducting materials and fullerites by electron microscopy
Author(s) -
van Tendeloo Gustaaf,
Amelinckx Severin
Publication year - 1993
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19930050904
Subject(s) - materials science , superconductivity , electron microscope , cuprate , electron diffraction , crystallography , diffraction , copper , nanotechnology , microscopy , condensed matter physics , metallurgy , optics , chemistry , physics
High‐resolution electron microscopy (HREM) has proved invaluable in the study of local structure—i.e. defects—which in many cases govern the physical, chemical, and electrical properties of materials. The use of HREM in investigations of cuprate high‐temperature superconductors is reviewed, especially for compounds in which substituents replace some of the copper. HREM can also be very successfully combined with other techniques, such as electron diffraction, as is demonstrated by results of research on the structure and phase transitions of C 60 and C 70 .