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Scanning tunneling microscopy of nanoscale electrodeposited superlattices
Author(s) -
Switzer Jay A.,
Golden Teresa D.
Publication year - 1993
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19930050615
Subject(s) - scanning tunneling microscope , superlattice , materials science , nanoscopic scale , bilayer , superconductivity , quantum tunnelling , microscopy , electrochemical scanning tunneling microscope , scanning probe microscopy , nanotechnology , spin polarized scanning tunneling microscopy , scanning tunneling spectroscopy , condensed matter physics , optics , optoelectronics , membrane , physics , biology , genetics
Artificially layered superconductor materials based on crystalline multilayer structure are of potential interest due to the unusual quantum effects which could be expected in materials of this type. Scanning tunneling microscopy has recently been used (e.g. see Figure) to measure the modulation wavelength (the bilayer thickness) and to estimate the composition profile in such superlattices.