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X‐ray determination of the crystal structure and orientation of vacuum evaporated sexithiophene films
Author(s) -
Servet Bernard,
Ries Simone,
Trotel Marie,
Alnot Patrick,
Horowitz Gilles,
Garnier Francis
Publication year - 1993
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19930050611
Subject(s) - materials science , substrate (aquarium) , orientation (vector space) , diffraction , crystallography , optoelectronics , nanotechnology , optics , geometry , oceanography , physics , mathematics , chemistry , geology
The crystalline orientation of oligothiophenes has a profound effect on the electronic properties of the materials, which are of interest for example in the construction of all‐organic field‐effect transistors. Here, an X‐ray diffraction study of oligothiophene films is reported and the possible routes to improving the crystalline orientation discussed. It is found that α‐substitution or indeed heating of the substrate can lead to increased orientation of the oligomers.