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Thin‐film calorimetry and molecular electronics
Author(s) -
Wright John D.
Publication year - 1991
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19910030411
Subject(s) - materials science , doping , thermal , organic semiconductor , sensitivity (control systems) , optoelectronics , electronics , semiconductor , nanotechnology , process (computing) , interferometry , thin film , organic electronics , engineering physics , optics , electronic engineering , computer science , electrical engineering , voltage , transistor , physics , meteorology , engineering , operating system
Research News: Understanding the effect of the doping process on organic semiconductors is a crucial step in the design of, for example, organic‐based gas sensors. A method is presented her which allows the thermal changes which accompany the various steps in the doping process to be accurately monitored. The technique combines the high sensitivity of interferometric detection with the low thermal mass of a single‐mode optical fiber.