Characterization and modification of conducting substrates for ultrathin organic films by scanning tunneling microscopy | Zendy

Buchholz Stefan | Zendy; Fuchs Harald | Zendy; Rabe Jürgen P. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

Characterization and modification of conducting substrates for ultrathin organic films by scanning tunneling microscopy

Author(s) -

Buchholz Stefan,

Fuchs Harald,

Rabe Jürgen P.

Publication year - 1991

Publication title -

advanced materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 10.707

H-Index - 527

eISSN - 1521-4095

pISSN - 0935-9648

DOI - 10.1002/adma.19910030110

Subject(s) - materials science , scanning tunneling microscope , highly oriented pyrolytic graphite , nucleation , substrate (aquarium) , characterization (materials science) , pyrolytic carbon , nanotechnology , surface modification , graphite , scanning probe microscopy , chemical engineering , organic chemistry , composite material , pyrolysis , chemistry , engineering , oceanography , geology

Communication : The structure of an organic film of molecular thickness depends strongly on the surface properties of the underlying substrate. STM is a method which enables a substrate surface to be characterized and controlled as demonstrated in the figure, where the letter “U” etched with an STM tip into a highly oriented pyrolytic graphite (HOPG) surface is shown. The holes, which are around 5 nm in diameter, could serve as nucleation sites for an organic adsorbate phase.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research