Premium
Optical and surface‐analytical methods for the characterization of ultrathin organic films
Author(s) -
Bubeck Christoph,
Holtkamp Dieter
Publication year - 1991
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19910030107
Subject(s) - materials science , characterization (materials science) , surface (topology) , nanotechnology , mathematics , geometry
Review: The elemental and molecular composition of polymeric organic films can be studied using techniques such as secondary ion mass spectrometry (SIMS), infrared and Raman spectroscopy and X‐ray photoelectron spectroscopy (XPS). These non‐destructive methods also reveal information on depth profiles, molecular organization, and interface effects. The techniques and improvemetns made specifically for the study of monolayers and LB films using vibrational spectroscopy are described.