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Structural Characterization of Monolayers at the air–water interface
Author(s) -
Möbius Dietmar,
Möhwald Helmuth
Publication year - 1991
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19910030104
Subject(s) - characterization (materials science) , monolayer , materials science , diffraction , spectroscopy , fluorescence spectroscopy , microscopy , reflection (computer programming) , nanotechnology , interface (matter) , fluorescence , chemical engineering , optics , composite material , contact angle , physics , engineering , quantum mechanics , computer science , programming language , sessile drop technique
Review: X‐Ray diffraction, fluorescence microscopy, and reflection spectroscopy , are all methods used for the characterization of organic thin films which enable the study of, for example, dipole layers, domain structures, mechanical surface excitations, and the orientation of the hydrocarbon ‘tails’. The methods and their applications, especially in the optimization of monolayer formation and transfer, are reviewed.