van der waals interactions in force microscopy | Zendy

Hartmann Uwe | Zendy

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van der waals interactions in force microscopy

Author(s) -

Hartmann Uwe

Publication year - 1990

Publication title -

advanced materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 10.707

H-Index - 527

eISSN - 1521-4095

pISSN - 0935-9648

DOI - 10.1002/adma.19900021208

Subject(s) - van der waals force , microprobe , materials science , scanning force microscopy , microscopy , force field (fiction) , electrostatic force microscope , van der waals surface , nanotechnology , chemical physics , resolution (logic) , atomic force microscopy , van der waals radius , optics , mineralogy , chemistry , physics , molecule , quantum mechanics , artificial intelligence , computer science , organic chemistry

Due to its high sensitivity, scanning force microscopy offers the possibility to map minute van der Waals forces between microprobe and sample surface at high spatial resolution. A detailed theoretical analysis confirms that the interactions involved directly reflect near‐surface dielectric properties hardly accessible to conventional detection techniques. This opens a new field of application to modern scanned‐probe techniques: van der Waals microscopy.

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