Magnetic force microscopy | Zendy

Hartmann Uwe | Zendy

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Magnetic force microscopy

Author(s) -

Hartmann Uwe

Publication year - 1990

Publication title -

advanced materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 10.707

H-Index - 527

eISSN - 1521-4095

pISSN - 0935-9648

DOI - 10.1002/adma.19900021110

Subject(s) - magnetic force microscope , materials science , atomic force microscopy , microprobe , microscopy , resolution (logic) , magnetic resonance force microscopy , conductive atomic force microscopy , ferromagnetism , electrostatic force microscope , atomic force acoustic microscopy , optics , nanotechnology , magnetic field , magnetization , condensed matter physics , physics , mineralogy , chemistry , computer science , ferromagnetic resonance , artificial intelligence , quantum mechanics

Sensitive mapping of near‐surface microfields produced by ferromagnetic media is possible with a spacial resolution under 100 nm using magnetic force microscopy (MFM), a technique related to atomic force microscopy. The method is described and the development of a novel type of MFM microprobe tip (see figure) is also reported.

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