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Magnetic force microscopy
Author(s) -
Hartmann Uwe
Publication year - 1990
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19900021110
Subject(s) - magnetic force microscope , materials science , atomic force microscopy , microprobe , microscopy , resolution (logic) , magnetic resonance force microscopy , conductive atomic force microscopy , ferromagnetism , electrostatic force microscope , atomic force acoustic microscopy , optics , nanotechnology , magnetic field , magnetization , condensed matter physics , physics , mineralogy , chemistry , computer science , ferromagnetic resonance , artificial intelligence , quantum mechanics
Sensitive mapping of near‐surface microfields produced by ferromagnetic media is possible with a spacial resolution under 100 nm using magnetic force microscopy (MFM), a technique related to atomic force microscopy. The method is described and the development of a novel type of MFM microprobe tip (see figure) is also reported.