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Surface analysis II. Surface‐plasmon enhanced resolution in optical microscopy
Author(s) -
Rabe Jürgen P.
Publication year - 1990
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19900020208
Subject(s) - materials science , surface plasmon , surface plasmon polariton , optics , plasmon , resolution (logic) , wavelength , microscopy , optical microscope , localized surface plasmon , aperture (computer memory) , surface plasmon resonance , optoelectronics , microscope , near field scanning optical microscope , near field optics , nanotechnology , scanning electron microscope , nanoparticle , physics , artificial intelligence , computer science , acoustics , composite material
Methods of improving the resolution of optical microscopes which involve, for example, forcing the light through an aperture which is smaller than the wavelength of the light (see Figure) or the coupling of the light to a plasmon to form a surface‐plasmon polariton are described. The latter method is particularly suitable for determining, for example, the optical thickness of an ultrathin transparent film with high precision on a micron scale.