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Structural characterization of non‐oxide Chalcogenide Glasses using solid state NMR
Author(s) -
Eckert Hellmut
Publication year - 1989
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19890011203
Subject(s) - chalcogenide , materials science , characterization (materials science) , oxide , semiconductor , nanotechnology , silicon , boron , chalcogenide glass , infrared , solid state , engineering physics , optoelectronics , optics , metallurgy , organic chemistry , chemistry , physics , engineering
In spite of the long‐standing importance of non‐oxide chalcogenide glasses in infrared optics and semiconductor technology, concepts describing the structural principles governing glass formation in these systems are just emerging. Most recently, modern quantitative solid state NMR techniques have offered new unique insights into the structural organization of these systems. In this review, we discuss the basic principles of various experimental approaches and their application to boron‐silicon,‐ and phosphorus chalcogenide glasses.