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Electronics reliability and measurement technology–non‐destructive evaluation. Edited by Joseph S. Heyman , Noyes Publications, 1988, xii, 188 pp., bound, $ 39.–. ISBN 0‐8155‐1171‐X
Author(s) -
Reiner Hans
Publication year - 1989
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19890011119
Subject(s) - citation , electronics , reliability (semiconductor) , computer science , materials science , engineering physics , physics , nanotechnology , library science , electrical engineering , thermodynamics , engineering , power (physics)