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Surface analysis I. Imaging surfaces, electric charges and magnetic domains with the atomic force microscope
Author(s) -
Rabe Jürgen P.
Publication year - 1989
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.19890011108
Subject(s) - atomic force microscopy , materials science , magnetic force microscope , atomic units , nanotechnology , surface (topology) , conductive atomic force microscopy , photoconductive atomic force microscopy , kelvin probe force microscope , scanning capacitance microscopy , magnetic field , scanning electron microscope , composite material , scanning confocal electron microscopy , physics , magnetization , geometry , mathematics , quantum mechanics
Surface Analysis I. Atomic Force Microscopy (AFM) provides a method of imaging surfaces on an atomic scale. Closely related to STM, AFM can, however, image insulating materials such as organic molecules. The technique is described and some recent applications discussed in the first article of a regular series from Jürgen Rube on surface analysis techniques.