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Enhanced Hole‐Carrier Selectivity in Wide Bandgap Halide Perovskite Photovoltaic Devices for Indoor Internet of Things Applications
Author(s) -
Lee Minwoo,
Choi Eunyoung,
Soufiani Arman Mahboubi,
Lim Jihoo,
Kim Moonyong,
Chen Daniel,
Green Martin Andrew,
Seidel Jan,
Lim Sean,
Kim Jincheol,
Dai Xinchen,
LeeChin Robert,
Zheng Bolin,
Hameiri Ziv,
Park Jongsung,
Hao Xiaojing,
Yun Jae Sung
Publication year - 2021
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.202008908
Subject(s) - materials science , perovskite (structure) , optoelectronics , kelvin probe force microscope , ultraviolet photoelectron spectroscopy , grain boundary , halide , band gap , x ray photoelectron spectroscopy , nanotechnology , chemical engineering , composite material , inorganic chemistry , microstructure , chemistry , engineering , atomic force microscopy
Halide perovskite‐based photovoltaic (PV) devices have recently emerged for low energy consumption electronic devices such as Internet of Things (IoT). In this work, an effective strategy to form a hole‐selective layer using phenethylammonium iodide (PEAI) salt is presented that demonstrates unprecedently high open‐circuit voltage of 0.9 V with 18 µW cm −2 under 200 lux (cool white light‐emitting diodes). An appropriate post‐deposited amount of PEAI (2 mg) strongly interacts with the perovskite surface forming a conformal coating of PEAI on the perovskite film surface, which improves the crystallinity and absorption of the film. Here, Kelvin probe force microscopy results indicate the diminished potential difference across the grain boundaries and grain interiors after the PEAI deposition, constructing an electrically and chemically homogeneous surface. Also, the surface becomes more p‐type with a downshift of a valence band maximum, confirmed by ultraviolet photoelectron spectroscopy measurement, facilitating the transport of holes to the hole transport layer (HTL). The hole‐selective layer‐deposited devices exhibit reduced hysteresis in light current density–voltage curves and maintain steadily high fill factor across the different light intensities (200–1000 lux). This work highlights the importance of the HTL/perovskite interface that prepares the indoor halide perovskite PV devices for powering IoT device.