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Special Issue: Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up (Adv. Funct. Mater. 52/2019)
Author(s) -
Kalinin Sergei V.,
Dyck Ondrej
Publication year - 2019
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.201970352
Subject(s) - materials science , fabrication , nanolithography , nanotechnology , scanning tunneling microscope , quantum tunnelling , perspective (graphical) , optoelectronics , computer science , medicine , alternative medicine , pathology , artificial intelligence
This special issue provides an overview from the perspective of atomic fabrication for quantum devices, to discuss the well‐established scanning tunneling microscopy‐based nanofabrication and to showcase the materials systems amenable for e‐beam fabrication, associated applications, and theory.