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Perovskite Films: Mapping Morphological and Structural Properties of Lead Halide Perovskites by Scanning Nanofocus XRD (Adv. Funct. Mater. 45/2016)
Author(s) -
Lilliu Samuele,
Dane Thomas G.,
Alsari Mejd,
Griffin Jonathan,
Barrows Alexander T.,
Dahlem Marcus S.,
Friend Richard H.,
Lidzey David G.,
Macdonald J. E.
Publication year - 2016
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.201670297
Subject(s) - materials science , perovskite (structure) , crystallite , halide , synchrotron , thin film , nanotechnology , optoelectronics , chemical engineering , optics , inorganic chemistry , metallurgy , chemistry , physics , engineering
On page 8221, S. Lilliu and co‐workers show how synchrotron nXRD can be used to simultaneously probe the morphology and the structural properties of spin‐coated CH 3 NH 3 PbI 3 perovskite films for photovoltaic devices. A method to visualize, selectively isolate, and structurally characterize single perovskite grains buried within a complex, polycrystalline film is developed.