Perovskite Films: Mapping Morphological and Structural Properties of Lead Halide Perovskites by Scanning Nanofocus XRD (Adv. Funct. Mater. 45/2016) | Zendy

Lilliu Samuele | Zendy; Dane Thomas G. | Zendy; Alsari Mejd | Zendy; Griffin Jonathan | Zendy; Barrows Alexander T. | Zendy; Dahlem Marcus S. | Zendy; Friend Richard H. | Zendy; Lidzey David G. | Zendy; Macdonald J. E. | Zendy

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Perovskite Films: Mapping Morphological and Structural Properties of Lead Halide Perovskites by Scanning Nanofocus XRD (Adv. Funct. Mater. 45/2016)

Author(s) -

Lilliu Samuele,

Dane Thomas G.,

Alsari Mejd,

Griffin Jonathan,

Barrows Alexander T.,

Dahlem Marcus S.,

Friend Richard H.,

Lidzey David G.,

Macdonald J. E.

Publication year - 2016

Publication title -

advanced functional materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 6.069

H-Index - 322

eISSN - 1616-3028

pISSN - 1616-301X

DOI - 10.1002/adfm.201670297

Subject(s) - materials science , perovskite (structure) , crystallite , halide , synchrotron , thin film , nanotechnology , optoelectronics , chemical engineering , optics , inorganic chemistry , metallurgy , chemistry , physics , engineering

On page 8221, S. Lilliu and co‐workers show how synchrotron nXRD can be used to simultaneously probe the morphology and the structural properties of spin‐coated CH 3 NH 3 PbI 3 perovskite films for photovoltaic devices. A method to visualize, selectively isolate, and structurally characterize single perovskite grains buried within a complex, polycrystalline film is developed.

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