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Self‐Limited Switching in Ta 2 O 5 /TaO x Memristors Exhibiting Uniform Multilevel Changes in Resistance
Author(s) -
Kim Kyung Min,
Lee Seung Ryul,
Kim Sungho,
Chang Man,
Hwang Cheol Seong
Publication year - 2015
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.201403621
Subject(s) - memristor , materials science , optoelectronics , switching time , oxide , high resistance , nanotechnology , random access memory , condensed matter physics , topology (electrical circuits) , electrical engineering , computer science , physics , agronomy , computer hardware , metallurgy , biology , engineering
To facilitate the development of memristive devices, it is essential to resolve the problem of non‐uniformity in switching, which is caused by the random nature of the filamentary switching mechanism in many resistance switching memories based on transition metal oxide. In addition, device parameters such as low‐ and high‐state resistance should be regulated as desired. These issues can be overcome if memristive devices have switching limits for both the low‐ and high‐resistance states and if their resistance values are highly controllable. In this study, a method termed self‐limited switching for uniformly regulating the values of both the low‐ and high‐resistance states is suggested, and the circuit configuration required for the self‐limited switching is established in a Ta 2 O 5 /TaO x memristive structure. A method of improving the uniformity of multi‐level resistance states in this memristive system is also proposed.