Premium
Surface Characterization: Non‐Invasive High‐Throughput Metrology of Functionalized Graphene Sheets (Adv. Funct. Mater. 21/2012)
Author(s) -
Ghazinejad Maziar,
Kyle Jennifer Reiber,
Guo Shirui,
Pleskot Dennis,
Bao Duoduo,
Vullev Valentine I.,
Ozkan Mihrimah,
Ozkan Cengiz S.
Publication year - 2012
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.201290128
Subject(s) - graphene , materials science , metrology , characterization (materials science) , nanotechnology , fluorescence , quenching (fluorescence) , doping , graphene nanoribbons , graphene oxide paper , optoelectronics , optics , physics
On page 4519 , Mihrimah Ozkan, Cengiz S. Ozkan, and co‐workers report a new fluorescence quenching microscopy metrology technique that allows the identification of graphene layers and doped/undoped regions across a large graphene landscape by utilizing the fact that undoped regions of graphene quench fluorescence more than the doped regions through resonant energy transfer. Contrast differences in fluorescence across the graphene sheet reveal the complex ring‐patterned doping. This metrology technique is well‐suited for industrial, large‐scale, pristine, and modified graphene sheet surface characterization.