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Solvent‐Induced Morphology in Polymer‐Based Systems for Organic Photovoltaics
Author(s) -
Ruderer Matthias A.,
Guo Shuai,
Meier Robert,
Chiang HsinYin,
Körstgens Volker,
Wiedersich Johannes,
Perlich Jan,
Roth Stephan V.,
MüllerBuschbaum Peter
Publication year - 2011
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.201100945
Subject(s) - materials science , grazing incidence small angle scattering , spin coating , annealing (glass) , chemical engineering , crystallization , photoluminescence , thin film , solar cell , organic solar cell , nanocrystalline material , scattering , polymer , optoelectronics , optics , nanotechnology , composite material , small angle neutron scattering , physics , neutron scattering , engineering
Studies on the influence of four different solvents on the morphology and photovoltaic performance of bulk‐heterojunction films made of poly(3‐hexylthiophene) (P3HT) and [6,6]‐phenyl‐C 61 butyric acid methyl ester (PCBM) via spin‐coating for photovoltaic applications are reported. Solvent‐dependent PCBM cluster formation and P3HT crystallization during thermal annealing are investigated with optical microscopy and grazing‐incidence wide‐angle X‐ray scattering (GIWAXS) and are found to be insufficient to explain the differences in device performance. A combination of atomic force microscopy (AFM), X‐ray reflectivity (XRR), and grazing‐incidence small‐angle X‐ray scattering (GISAXS) investigations results in detailed knowledge of the inner film morphology of P3HT:PCBM films. Vertical and lateral phase separation occurs during spin‐coating and annealing, depending on the solvent used. The findings are summarized in schematics and compared with the IV characteristics. The main influence on the photovoltaic performance arises from the vertical material composition and the existence of lateral phase separation fitting to the exciton diffusion length. Absorption and photoluminescence measurements complement the structural analysis.