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Noninvasive Semiconductor Field Imaging: Imaging the Electric‐Field Distribution in Organic Devices by Confocal Electroreflectance Microscopy (Adv. Funct. Mater. 8/2009)
Author(s) -
Celebrano Michele,
Sciascia Calogero,
Cerullo Giulio,
ZavelaniRossi Margherita,
Lanzani Guglielmo,
CabanillasGonzalez Juan
Publication year - 2009
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.200990028
Subject(s) - materials science , confocal microscopy , confocal , planar , electric field , microscopy , optoelectronics , image resolution , optical microscope , semiconductor , optics , nanotechnology , scanning electron microscope , computer science , physics , computer graphics (images) , quantum mechanics , composite material
Noninvasive methods for diagnosis of organic devices are based on optical probes. At Politecnico di Milano, M. Celebrano et al. have developed a new method to optically map the electric field inside organic planar devices, as described on page 1180 . Their technique involves the combination of electroreflectance spectroscopy with confocal microscopy to achieve high spatial resolution. The cover image shows an artistic impression of the optical probing of a CuPcF 16 ‐based device.
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