Microscopical Investigations of PEDOT:PSS Thin Films | Zendy

Lang Udo | Zendy; Müller Elisabeth | Zendy; Naujoks Nicola | Zendy; Dual Jurg | Zendy

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Microscopical Investigations of PEDOT:PSS Thin Films

Author(s) -

Lang Udo,

Müller Elisabeth,

Naujoks Nicola,

Dual Jurg

Publication year - 2009

Publication title -

advanced functional materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 6.069

H-Index - 322

eISSN - 1616-3028

pISSN - 1616-301X

DOI - 10.1002/adfm.200801258

Subject(s) - pedot:pss , materials science , polystyrene sulfonate , polystyrene , composite material , morphology (biology) , scanning electron microscope , thin film , spectroscopy , atomic force microscopy , electron microscope , nanotechnology , polymer , optics , physics , quantum mechanics , biology , genetics

Electron microscopy studies are used to explore the morphology of thin poly(3,4‐ethylenedioxythiophene) and polystyrene sulfonate acid (PEDOT:PSS) films. The figures show that the films are composed of grains with diameters in the range of about 50 nm. Energy dispersive X‐ray spectroscopy analysis reveals that individual grains have a PEDOT‐rich core and a PSS‐rich shell with a thickness of about 5–10 nm. Atomic force microscopy (AFM) is then used to analyze the topography of fracture surfaces of ruptured PEDOT:PSS tensile specimens. These AFM scans also show that the films are composed of grains dispersed in a matrix. The investigations presented herein yield a picture of PEDOT:PSS morphology with unprecedented clarity.

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