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Template Growth of Nanocrystalline PbS, CdS, and ZnS on a Polydiacetylene Langmuir Film: An In Situ Grazing Incidence X‐ray Diffraction Study
Author(s) -
Lifshitz Y.,
Konovalov O.,
Belman N.,
Berman A.,
Golan Y.
Publication year - 2006
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.200600020
Subject(s) - materials science , nanocrystalline material , nanocrystal , diffraction , chemical bath deposition , in situ , zinc , semiconductor , thin film , crystallography , nanotechnology , chemical engineering , optics , optoelectronics , metallurgy , organic chemistry , chemistry , physics , engineering
Chemical deposition of nanocrystalline PbS, CdS, and ZnS at the air/solution interface in the absence and presence of a polydiacetylene (PDA) Langmuir film is investigated in situ using grazing incidence X‐ray diffraction. In all cases, it is found that PDA has a pronounced effect on the incipient semiconductor nanocrystals (NCs). In the presence of PDA, PbS NCs showed a <111> orientation in addition to the commonly obtained <100> growth direction of the PbS rock salt structure while CdS and ZnS NCs crystallized in the zinc blende polymorph with a predominant <100> orientation. ZnS NCs were obtained only in the presence of PDA at the air/solution interface.

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