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Characterization and Field‐Emission Properties of Vertically Aligned ZnO Nanonails and Nanopencils Fabricated by a Modified Thermal‐Evaporation Process
Author(s) -
Shen G. Z.,
Bando Y.,
Liu B. D.,
Golberg D.,
Lee C.J.
Publication year - 2006
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.200500571
Subject(s) - materials science , photoluminescence , field electron emission , raman spectroscopy , silicon , characterization (materials science) , substrate (aquarium) , evaporation , layer (electronics) , diffraction , nanotechnology , transmission electron microscopy , thermal , adiabatic process , nanostructure , chemical engineering , analytical chemistry (journal) , optoelectronics , optics , electron , oceanography , physics , chemistry , engineering , chromatography , quantum mechanics , geology , thermodynamics , meteorology
Vertically aligned ZnO nanonails and nanopencils are synthesized on a silicon substrate using a modified thermal‐evaporation process, without using a catalyst or predeposited buffer layers. An adiabatic layer is used to provide an abrupt temperature decrease and high gas concentration for the nanostructures growth. The structure and morphology of the as‐synthesized ZnO nanonails and nanopencils are characterized using X‐ray diffraction, and scanning and transmission electron microscopies. Raman and photoluminescence properties are also investigated at room temperature. Field‐emission characterization shows that the turn‐on fields for the vertically aligned ZnO nanonails and nanopencils are 7.9 and 7.2 V μm –1 , respectively.