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Characterization and Growth Process of Copper Nanodisks
Author(s) -
Salzemann C.,
Urban J.,
Lisiecki I.,
Pileni M.P.
Publication year - 2005
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.200400594
Subject(s) - materials science , copper , transmission electron microscopy , micelle , nanocrystal , characterization (materials science) , nanotechnology , crystallography , high resolution transmission electron microscopy , chemical engineering , chemical physics , metallurgy , chemistry , aqueous solution , physics , engineering
Copper nanocrystals with plate‐like morphologies and face‐centered cubic (fcc) structures have been synthesized in mixed reverse micelles with a large excess of reducing agent. High‐resolution transmission electron microscopy images and image simulations show the presence of multiple twin defects parallel to the (111) surface responsible for the forbidden reflections 1/3{422} of the fcc structure. A growth process related to the formation of twin defects is proposed to explain the existence of these morphologies.