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Heterogeneous Strain Distribution and Saturation of Geometrically Necessary Dislocations in a Ferritic–Pearlitic Steel during Lubricated Sliding
Author(s) -
Linz Mathias,
Rodríguez Ripoll Manel,
Pauly Christoph,
Bernardi Johannes,
SteigerThirsfeld Andreas,
Franek Friedrich,
Mücklich Frank,
Gachot Carsten
Publication year - 2018
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.201700810
Subject(s) - materials science , electron backscatter diffraction , grain boundary , dislocation , grain boundary sliding , pearlite , grain boundary strengthening , composite material , metallurgy , ferrite (magnet) , transmission electron microscopy , crystallography , microstructure , austenite , chemistry , nanotechnology
The microstructural evolution of ferritic–pearlitic steel is studied during unidirectional sliding under boundary lubrication using a ball‐on‐flat configuration. Dislocation activity as a function of distance to surface is determined using orientation gradients by electron backscatter diffraction in logarithmic intervals up to one million of sliding cycles. The orientation gradient results show the formation of geometrically necessary dislocations and low‐angle grain boundaries, followed by a consolidation of those grain boundaries as nanocrystalline grains. The density of geometrically necessary dislocations and low‐angle grain boundaries is observed to reach a steady state after around 100 000 cycles. Plastic strain is not homogeneously distributed within both material phases, that is, ferrite and pearlite. Most of the plastic deformation is carried by the ferritic phase. The heterogeneous strain distribution between the ferritic and the pearlitic phase observed in the electron backscatter diffraction measurements is attributed to stress incompatibilities at the grain boundaries. Dislocation pile‐up at the ferritic–pearlitic interface is observed at high resolution using transmission electron microscopy and transmission Kikuchi diffraction.