Premium
Crystallography of Martensitic Transformation in Epitaxial Ni 50 Mn 30 Ga 20 Thin Film
Author(s) -
Yang Bo,
Liu Tingting,
Hao Xiao Wen,
Li Zong Bin,
Zhang Yu Dong,
Qin Gao Wu,
Philippe MarieJeanne,
Esling Claude,
Zhao Xiang,
Zuo Liang
Publication year - 2018
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.201700171
Subject(s) - martensite , materials science , austenite , bainite , electron backscatter diffraction , crystallography , microstructure , metallurgy , chemistry
In the present work, scanning electron microscopy and electron backscatter diffraction technique revealed that the microstructure of epitaxial Ni 50 Mn 30 Ga 20 thin films are composed of six different orientated NM martensite variant colonies. In each martensite variant colony, there are eight different orientated NM martensite variants. The six NM and 7M martensite variant colonies are transformed from six (101) A planes of austenite, with the transformation consequence from Austenite to 7M martensite and then to NM martensite. Cross section TEM examination reveals the coexistence of 7M martensite and NM martensite. The habit plane between 7M martensite and NM martensite can be determined as (001) mono of 7M martensite and (112) Tetr of NM martensite.