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Atom Probe Tomography Study of As‐Quenched Al–Mg–Si Alloys
Author(s) -
Dumitraschkewitz Phillip,
Gerstl Stephan S. A.,
Uggowitzer Peter J.,
Löffler Jörg F.,
Pogatscher Stefan
Publication year - 2017
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.201600668
Subject(s) - atom probe , materials science , microstructure , diffusion , quenching (fluorescence) , atom (system on chip) , radial distribution function , liquid nitrogen , ion , analytical chemistry (journal) , metallurgy , thermodynamics , fluorescence , optics , computational chemistry , chemistry , physics , organic chemistry , computer science , embedded system , molecular dynamics , chromatography
This study deploys a new method to gain insight into the as‐quenched microstructure of Al–Mg–Si alloys using atom probe tomography (APT) as an imaging method. Here, diffusion of solutes during sample preparation and handling is suppressed via application of cryogenic temperatures beginning from quenching in liquid nitrogen (LN2) through to APT experiments at 33 K. The solute distribution is studied via customized nearest‐neighbor distribution and radial distribution function analysis. The influence of energy input on the solute distribution via cryogenic focused ion beam (FIB) preparation is also shown.