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Energy‐Filtered Backscattered Imaging Using Low‐Voltage Scanning Electron Microscopy: Characterizing Blends of ZnPc–C 60 for Organic Solar Cells
Author(s) -
Garitagoitia Cid Aránzazu,
Sedighi Mona,
Löffler Markus,
van Dorp Willem F.,
Zschech Ehrenfried
Publication year - 2016
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.201600063
Subject(s) - materials science , scanning electron microscope , optoelectronics , solar cell , polymer solar cell , organic solar cell , electron , secondary electrons , acceleration voltage , heterojunction , detector , optics , composite material , cathode ray , physics , quantum mechanics , polymer
Energy‐filtered backscattered electron imaging in a scanning electron microscope is performed on a blend of zinc‐phthalocyanine (ZnPc) and fullerene (C 60 ), whose morphology is characterized using a novel energy selective backscattered (EsB) electron detector in combination with low acceleration voltages for the primary electrons. Such blends are used as an active layer of organic solar cells in bulk heterojunction architectures. The key to optimizing the solar cell performance is understanding the morphology of the blend components. Comparing the results to TEM micrographs, the EsB detector allows for a simple and fast identification of the phases in the blend. The relevance of the findings for applying ZnPc–C 60 blends in solar cells is also discussed.