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Microstructural Evolution of Severely Plastically Deformed Sensitized Aluminum 5456‐ H 116 Treated by Ultrasonic Impact Treatment
Author(s) -
Tran Kim N.,
SalamancaRiba Lourdes
Publication year - 2013
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.201300095
Subject(s) - materials science , microstructure , recrystallization (geology) , aluminium , ultrasonic sensor , composite material , phase (matter) , metallurgy , severe plastic deformation , surface layer , layer (electronics) , chemistry , paleontology , organic chemistry , biology , physics , acoustics
Sensitized aluminum 5456‐H116 is characterized by a continuous network of β phase. The use of ultrasonic impact treatment refines the near surface microstructure to produce nanograins that vary in size from 2 to 200 nm in diameter. The deformation layer does not exhibit the presence of a continuous β phase indicating that the near surface microstructure undergoes recrystallization.