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Orientation Gradients at Boundaries in Micron‐Sized Bicrystals
Author(s) -
Kheradmand Nousha,
Vehoff Horst
Publication year - 2012
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.201100242
Subject(s) - materials science , electron backscatter diffraction , dislocation , slip (aerodynamics) , diffraction , plasticity , scattering , crystallography , composite material , orientation (vector space) , hardening (computing) , condensed matter physics , geometry , optics , microstructure , physics , chemistry , mathematics , layer (electronics) , thermodynamics
In micron‐sized Ni bicrystals, after compression tests, orientation gradients are measured by electron back scattering diffraction (EBSD). The results clearly show that EBSD can be used to study dislocation pile‐ups at boundaries. Using bicrystals with single and multiple slip orientations our results show that with decreasing the size of the pillars the orientation changes due to cross‐slip decreases and the orientation changes at the boundary increases. This directly indicates a change in the hardening mechanism when the probability of dislocation–dislocation interaction decreases due to source‐limited plasticity in the bicrystals with diameters below approximately two microns.