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In Situ µLaue: Instrumental Setup for the Deformation of Micron Sized Samples
Author(s) -
Kirchlechner Christoph,
Keckes Jozef,
Micha JeanSebastien,
Dehm Gerhard
Publication year - 2011
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.201000286
Subject(s) - materials science , pillar , compression test , in situ , synchrotron , slip (aerodynamics) , deformation (meteorology) , diffraction , composite material , copper , compression (physics) , optics , metallurgy , mechanical engineering , chemistry , physics , engineering , thermodynamics , organic chemistry
µLaue diffraction sheds light onto the deformation behavior of miniaturized samples. Here we present a new instrumental setup for the in situ deformation of micron sized specimens at BM32 of the ESRF synchrotron source. Furthermore, a compression test of a 7 µm sized single slip oriented copper pillar is presented, showing the activation of an unpredicted slip system due to misalignment and the formation of several sub‐grains. The results of the compressed pillar as well as possibilities and crucial points for measuring and data evaluation are discussed.