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In situ Grazing Incidence Scattering Investigations During Magnetron Sputtering Deposition of FePt/Ag Thin Films (Adv. Eng. Mater. 6/2009)
Author(s) -
Cantelli Valentina,
von Borany Johannes,
Jeutter Nicole Martha,
Grenzer Jörg
Publication year - 2009
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200990014
Subject(s) - materials science , sputter deposition , thin film , beamline , scattering , sputtering , optics , deposition (geology) , layer (electronics) , cavity magnetron , in situ , optoelectronics , composite material , nanotechnology , beam (structure) , physics , paleontology , sediment , meteorology , biology
The cover picture shows an grazing incidence small angle X‐ray scattering pattern of a granular Ag(6nm)‐FePt(7.5nm)‐Ag‐FePt thin film using an in‐situ magnetron sputtering chamber measured directly after growth at the Beamline BM20 (ROBL) at the ESRF. The sequential deposition provides separated, faceted FePt nanoislands without any magnetic property degradation and with magnetic moments preferentially oriented parallel to layer surface. The central part of the picture was blocked by a beam stop to avoid an over‐saturation of the CCD detector. More details can be found in the article by Jörg Grenzer et al. on page 478 .