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Imaging of Cell‐to‐Material Interfaces by SEM after in situ Focused Ion Beam Milling on Flat Surfaces and Complex 3D‐Fibrous Structures
Author(s) -
Bittermann Anne Greet,
Burkhardt Claus,
Hall Heike
Publication year - 2009
Publication title -
advanced engineering materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.938
H-Index - 114
eISSN - 1527-2648
pISSN - 1438-1656
DOI - 10.1002/adem.200900080
Subject(s) - materials science , focused ion beam , characterization (materials science) , in situ , nanotechnology , ion beam , interface (matter) , visualization , nanostructure , ion milling machine , nanoscopic scale , beam (structure) , ion , composite material , computer science , optics , contact angle , chemistry , artificial intelligence , physics , sessile drop technique , layer (electronics) , organic chemistry
Detailed analysis of the cell‐to‐implant interface needs to be performed prior to medical application. As these interfaces are often not accessible for direct visualization SEM after in situ focused ion beam milling was explored that allows selecting the regions of interest and serial sectioning for analysis of large scale implant architecture/topology down to detailed sub‐cellular structures in one sample that might be very useful for (bio)material characterization.